X-ray fluorescence or XRF analysis is the characteristic emission of "secondary" (or fluorescent) X-rays from a material that has been excited by bombardment with high-energy X-rays or gamma rays.

X-ray diffraction or XRD analysis is a device for measuring the distances between atomic planes, or in other words, identifying the structure of materials, the result of which is determining the name of the mineral or minerals that make up the sample. The XRD X-ray diffraction spectrometer is widely used in identifying unknown crystalline solid samples. Among the things that can be determined in XRD are the detection of the crystal phase, the size and shape of the crystal grain, the composition of the crystal atoms and its structure, etc. The X-ray diffraction pattern is unique for each material.